A Digital IC Tester for Pin Failure Detection Using Microcontroller Technology Dodi Budiman Margana, Asri Rahmawati, Martin, Sabar Pramono, Yana Sudarsa
Politeknik Negeri Bandung
Abstract
The rapid advancement of electronic technology has increased the ubiquity of Integrated Circuits (ICs) in various applications, from consumer electronics to complex systems. In digital laboratories, ICs are essential for experiments and projects, but identifying their type and condition before use remains a significant challenge. This issue can lead to errors in IC selection or even damage to other circuit components. Traditional manual testing methods are time-consuming and inefficient, particularly when multiple ICs need to be tested. This research addresses the need for a reliable, efficient, and cost-effective IC testing solution by developing an Integrated Circuit Tester Kit. The tester kit is designed to quickly and accurately assess the type and condition of ICs, reducing testing time and minimizing errors. The device utilizes a microcontroller to perform tests, with results displayed on an LCD. The system^s accuracy is evaluated at 90% when compared to existing laboratory IC testers. The software design is based on the truth tables of various ICs, ensuring accurate verification. The tester displays ^IC rusak^ (IC Bad Condition) for faulty ICs and ^IC baik^ (IC Good Condition) for functional ones. This research concludes that the developed IC tester is a reliable and practical tool for digital laboratories, providing a significant improvement in testing efficiency and accuracy. The study^s findings suggest that the IC tester can effectively meet the needs of students and laboratory technicians, offering a streamlined and accessible solution for IC testing.
